The Opportunity of Anti-ferroelectrics in FeFET for Emerging Non-Volatile Memory Applications 

Year

2025 

Author

Hyojun Choi, Giuk Kim, Hunbeom Shin, Yunseok Nam, Sanghun Jeon, Kwangsoo Kim, Suhwan Lim, Jongho Woo, Wanki Kim, Daewon Ha, Jinho Ahn 

Conference

2025 IEEE International Reliability Physics Symposium (IRPS) 

Status

Accepted