"Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal–Ferroelectric–Insulator–Si (MFIS) FeFET"
Giuk Kim, Hyojun Choi, Sangho Lee, Hunbeom Shin, Sangmok Lee, Yunseok Nam, Hyunjun Kang, Seokjoong Shin, Hoon Kim, Youngjin Lim, Kang Kim, Il-Kwon Oh, Sang-Hee Ko Park, Jinho Ahn, Sanghun Jeon,
IEEE Transactions on Electron Devices,
Accepted,