The Opportunity of Anti-ferroelectrics in FeFET for Emerging Non-Volatile Memory Applications

Author

Hyojun Choi, Giuk Kim, Hunbeom Shin, Yunseok Nam, Sanghun Jeon, Kwangsoo Kim, Suhwan Lim, Jongho Woo, Wanki Kim, Daewon Ha, Jinho Ahn

Journal

2025 IEEE International Reliability Physics Symposium (IRPS)

Status

Accepted

Year

2025

Link

https://doi.org/10.1109/IRPS48204.2025.10982822 363회 연결