Charge Trap Flash with Superior Program Efficiency by Negative Capacitance-Boosting Effect

Author

Giuk Kim, Hyojun Choi, Sangho Lee, Hunbeom Shin, Lingwei Zhang, Sangmok Lee, Yunseok Nam, Woongjin Kim, Jihye Ock, Sujeong Lee, Hyunjun Kang, Sanghun Jeon

Journal

2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA)

Status

Accepted

Year

2024

Link

http://10.1109/VLSITSA60681.2024.10546371 411회 연결