Design Methodology for Low-Voltage Operational (≤1 V) FRAM Cell Capacitors and Approaches for Overcoming Disturb Issues in 1T-nC Arrays: Experimental & Modeling

Author

Sangho Lee†, Giuk Kim†, Chaeheon Kim, Yangjin Jung, Jeonghyun Hwang, Yunseok Nam, Mincheol Shin, Youngin Goh, Mintae Ryu, Jihye Suh, Kilho Lee, Wanki Kim, Daewon Ha, Jinho Ahn, Sanghun Jeon

Journal

2024 IEEE International Electron Devices Meeting (IEDM)

Status

Accepted

Year

2024

Link

http://doi.org/10.1109/IEDM50854.2024.10873568 651회 연결