ANTONIS Lab Publication

Highlights

Efficient Suppression of Defects and Charge Trapping in High Density In–Sn–Zn–O Thin Film Transistor Prepared using Microwave-Assisted Sputter
Author
Youngin Goh, Jaehan Ahn, Jeong Rak Lee, Wan Woo Park, Sang-Hee Ko Park, Sanghun Jeon
Journal
ACS Applied Materials & Interfaces
Vol
9
Page
36962-36970
Year
2017